Our surface characterisation and failure analysis equipment

 

MEB_EDX.jpg

SEM-EDX

Environmental scanning electron microscope (ESEM) coupled with energy-dispersive x-ray microanalysis (EDX)

 

High vacuum and low vacuum modes for conductive and insulating samples - Secondary and backscattered electron detector (topographic and chemical contrast) - EDX semi-quantitative chemical analysis (point mode, mapping, detection of elements from boron)

microscope_optique.jpg

Optical microscope

 
Request your quote
Quote

To be informed about latest news

Subscribe to our newsletter