---
type: "WebPage"
title: "Surface pollution on electronic devices in the laboratory"
description: "Preventing electronic failures due to surface contamination In critical electronic systems, even small surface contaminants can cause:Electrical driftIntermittent short circuitsLoss of performance or accuracy driftPremature component failure These contaminants can originate from manufacturing residues, fluxes, adhesives, surface treatments, or the..."
resource: "https://filab.fr/en/our-services/our-analysis-services/laboratory-surface-characterization/surface-pollution-electronic-devices-laboratory/"
tags: ["EN", "pll_694aa40b61035", "Arnaud JOUDRAIN"]
timestamp: "2025-12-31T08:29:08Z"
published: "2025-12-23T14:15:39Z"
language: "en"
author: "Théa Quilliou"
---

# Surface pollution on electronic devices in the laboratory

## Preventing electronic failures due to surface contamination

In critical electronic systems, **even small surface contaminants** can cause:

- Electrical drift
- Intermittent short circuits
- Loss of performance or accuracy drift
- Premature component failure

These contaminants can originate from manufacturing residues, fluxes, adhesives, surface treatments, or the operating environment.

  Services
## Services offered by FILAB

 FILAB supports industrial companies in the detection and control of surface pollution: Analyse de surface
- [Identification of organic and inorganic contaminants](https://filab.fr/en/our-services/our-expertise-services/laboratory-analysis-deposit-contamination.md)
- Characterization of deposits and residues on boards and components
- Verification of compliance with industry requirements

 Electronic failure expertise
[Material failure analysis](https://filab.fr/en/our-services/our-expertise-services/laboratory-analysis-failures.md): corrosion, fracture, adhesion

 Non-destructive testing
[NDT Expertise by X-ray Tomography](https://filab.fr/en/our-technical-resources/tomography-analysis-laboratory.md)

   Surface analysis
## Our techniques dedicated to materials expertise

 FILAB uses a specialized analytical facility for pollution analysis: [### SEM-EDX](https://filab.fr/en/our-technical-resources/laboratory-analysis-sem-scanning-electron-microscopy.md) [### SEM-FEG](https://filab.fr/en/our-technical-resources/laboratory-analysis-sem-scanning-electron-microscopy/laboratory-sem-analysis-automobile-aeronautical.md) [### AFM](https://filab.fr/en/our-technical-resources/atomic-force-microscopy-afm-laboratory.md) [### TOF-SIMS](https://filab.fr/en/our-technical-resources/laboratory-analysis-tof-sims.md) [### XPS](https://filab.fr/en/our-technical-resources/laboratory-analysis-xps-esca.md)
### Why choose Filab as your partner?

- **45 years of expertise** in materials analysis and testing
- Dual expertise in **chemistry and materials**
- Recognized expertise in **harsh environments and critical applications**
- **Ad hoc interventions or program support**
- Root cause **analysis and prevention approach**
- **Safran, Dassault Aviation, and Framatome accreditations**

## To go further

[Analysis according to guideline CPW 10](https://filab.fr/en/our-services/our-analysis-services/laboratory-surface-characterization/analytical-laboratory-according-to-guideline-cpw-10.md)

[Surface Deposition Analysis](https://filab.fr/en/our-services/our-expertise-services/laboratory-analysis-deposit-contamination.md)

[Surface analysis on optronic systems](https://filab.fr/en/our-services/our-analysis-services/laboratory-surface-characterization/surface-analysis-reliability-optronic-systems-laboratory-defense.md)

[Surface treatment failure on an optronic component](https://filab.fr/en/sectors-of-activity/laboratory-analyses-tests-defense-security-sector/surface-treatment-failure-optronic-component-embedded-laborator.md)

## FAQ

 What types of pollution can be detected?
- Stream residues,
- Chemical contaminants,
- Environmental deposits,
- Material incompatibilities.

 Can the origin of the defect be identified?
Yes. Materials expertise makes it possible to distinguish whether the pollution comes from the process, the storage or the environment via the analytical tools available to the FILAB laboratory.