---
type: "WebPage"
title: "Laboratory analysis of luxury goods by SEM-EDX"
description: "Your needs: characterization of materials by SEM-EDX for the luxury goods industry You need to characterise your materials as part of a launch, batch release or new regulation.The FILAB laboratory has been a partner of the luxury goods industry for..."
resource: "https://filab.fr/en/sectors-of-activity/laboratory-analysis-luxury-goods/sem-edx-analysis-at-filab-for-the-luxury-industry/"
tags: ["EN", "pll_612913cba4d43", "Arnaud JOUDRAIN"]
timestamp: "2025-12-31T08:56:23Z"
published: "2021-08-27T16:33:15Z"
language: "en"
author: "bwa"
---

# Laboratory analysis of luxury goods by SEM-EDX

## Your needs: characterization of materials by SEM-EDX for the luxury goods industry

 ![MEB-EDX](https://filab.fr/wp-content/uploads/elementor/thumbs/MEB1-08082023-VDEF-qk5bxta99v8ueebfwmsxse022ck616ecu1c1ofcixc.png)
You need to characterise your materials as part of a launch, batch release or new regulation.

The FILAB laboratory has been a partner of the luxury goods industry for many years. We can therefore offer you dedicated analysis services.

## Our solutions: SEM-EDX analysis for the luxury goods industry

The FILAB laboratory can provide you with SEM-EDX analysis of all types of materials for the luxury goods industry:

## our services

search for and [identification of pollution](https://filab.fr/en/our-services/our-expertise-services/laboratory-analysis-deposit-contamination.md), contamination, particles, etc.

expertise in [treatment failure](https://filab.fr/en/sectors-of-activity/laboratory-analysis-luxury-goods/luxury-industry-characterization-of-a-defect-of-aspect-in-laboratory.md): detachment, blistering, pitting, etc.

topographical examination: roughness, wear, friction, etc.

[surface treatment](https://filab.fr/en/our-services/our-analysis-services/laboratory-surface-characterization/surface-coating-thickness-measurement.md) characterization: thickness and nature of the stack

inclusion diagnosis: chemical composition

## Other technical resources SEM

Scanning Electron Microscopy FEG ([SEM FEG](https://filab.fr/en/our-technical-resources/laboratory-analysis-sem-scanning-electron-microscopy/laboratory-sem-analysis-automobile-aeronautical.md))

Scanning Electron Microscopy and Cryo ([SEM CRYO](https://filab.fr/en/laboratory-analysis-cryo-sem/))

Scanning Electron Microscopy ([STEM SEM](https://filab.fr/en/our-technical-resources/laboratory-analysis-sem-scanning-electron-microscopy/sem-stem-analysis-laboratory/))

Scanning Electron Microscopy EBSD ([SEM-EBSD](https://filab.fr/en/our-technical-resources/sem-ebsd-analysis-laboratory.md))

Scanning Electron Microscopy EDS ([SEM-EDS](https://filab.fr/en/our-technical-resources/sem-eds-analysis-laboratory/))