From Surface Analysis to Extreme Surface Analysis
The surface of a material is the site of all interactions with its environment and, through its specific characteristics, determines the performance and protection of materials.
Surface analyses can address several physicochemical issues:
- in the context of an investigation to determine the origin of a failure (corrosion, crack, adhesion problem, unknown contamination…)
- to optimize your manufacturing processes (surface treatment, machine settings…) and improve the performance of your materials.
- to control the quality of the surface condition of materials
Extreme Surface Analysis: More Specific Chemical Characterization
In addition to surface analytical techniques (SEM, Optical Microscopy…), techniques associated with extreme surface analysis make it possible to access more specific data for identifying the chemical environment of the elements and molecules present at the extreme surface of the material.
They are used in multi-sector investigation contexts such as:
- Identifying the chemical nature of a contamination or pollutant that may cause interface or cleanliness issues.
- Chemical surface characterization of a material (passivation and functionalization)
Our Extreme Surface Analytical Techniques
The FILAB laboratory has multisector expertise as well as a state-of-the-art analytical equipment park, enabling us to respond with high responsiveness and reliability to our clients’ surface and extreme surface analysis needs.
Our laboratory offers several complementary analytical techniques:
- TOF-SIMS
- XPS/ESCA
- AFM
- Profilometry; this is used to produce 3D topography images over larger areas for comparison with AFM.
Our expertise and our complementary strengths in chemistry and materials science ensure you a complete and reliable service for all your surface analysis needs.
Example of Problem Solving by Sector
Medical:
- Check the surface cleanliness of a medical device as part of a cleaning process validation approach
- Identify the presence of residual detergents on the surface of an implant through the complementary use of ToF-SIMS and XPS techniques
- Characterize the surface of a medical device: morphology by SEM-FEG, surface elemental chemistry by XPS analysis, molecular characterization by ToF-SIMS, contaminant detection…
- Characterize a surface functionalization by AFM (uniformity, friction, adhesion, deformation, roughness) and by XPS
Aerospace/Automotive:
- Assess a paint adhesion issue on a material (elemental identification of contamination by XPS or SEM-FEG, molecular analysis by TOF-SIMS…)
- Identify a sizing agent present on the surface of fibers for composite material development
- Characterize a passivation process on an aluminum alloy
- Analyze corrosion or nitriding that may lead to part failure by XPS
Electronics:
- Identify contamination present at the interface of a bonded assembly causing adhesion issues
- Investigate a failure following a loss of functionality in a system
Pharmaceutical:
- Identify contamination present on the internal surface of a glass vial
- Characterize the outermost surface of packaging presenting a sealing issue
