Analysis and characterization of powders in the laboratory

ICP AES

Dual Axial and Radial Aimed ICP AES atomic emission spectrometer.

Simultaneous system, Teflon injection system for HF solution, injection system for highly charged matrix, organic solution analysis.

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ICP - MS

ICP MS spectrometer equipped with a DRC (Dynamic Reaction Cell).

Quadrupole, detection limit down to ppt, Teflon injection system for HF solution, isotopic ratio.

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DRX

DRX MINIFLEX II

Source: Copper

Angular range : 0 to 120

Quantification method by refinement according to the Rietveld method

ICDD / JCPD database

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MEB FEG EDX

Environmental Scanning Electron Microscope (ESEM) coupled to an energy dispersive X-ray microprobe (EDX)

High-Vac and Low-Vac mode for conductive and insulating samples – Secondary and backscattered electron detector (topographic and chemical contrast) – Semi-quantitative chemical analysis EDX (point mode, mapping, detection from Boron).

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Sorptomètre (BET)

Micromeritics GEMINI VII

Measurement of the specific surface by nitrogen adsorption

Specific surface greater than 0.01 m²/g

6 degassing stations

Cell of 6,5 and 8,9 cm3

P/P0 resolution lower than 10-4

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