Analysis of particulate contamination on your powders by SEM-EDX
You wish to perform a particle contamination analysis on your powders by SEM-EDX
Why analyse particulate contamination on your powders by SEM-EDX?
Firstly, SEM-EDX is a microscopic analysis technique using a field effect gun (FEG). This technique produces very high resolution images (magnification of the order of *1000000).
In addition, the SEMs are coupled with EDX probes allowing extremely accurate analysis of particulate contamination on your powders. These SEM-EDX techniques are indeed equipped with a detection of signal in column 20 times more intense than that of a conventional Scanning Electron Microscope. Thus, the SEM-EDX allows non-destructive, accurate and fast observations and analysis of investigations.
The presence of particulate contamination in a powder can render it unusable and it is therefore necessary to identify the nature of this contamination in order to identify its origin and thus prevent this phenomenon.
Thus, the support of a laboratory equipped with SEM-EDX is essential when analysing particulate contamination on powders.
FILAB supports you in the analysis of particulate contamination on your powders by SEM-EDX
Through our three levels of services: analysis, expertise and R&D support, FILAB assists companies from all sectors in the analysis of particulate contamination on their powders by SEM-EDX. FILAB provides its clients with the know-how and experience of its team, as well as a 2100m² analytical park equipped with state-of-the-art equipment.
FILAB performs particle pollution analysis by SEM examination at G = 200 and also performs three EDX probe mappings.
To go further
Particle identification and counting
