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Micrographic analysis by SEM in the laboratory
You wish to carry out micrographic analysis by SEM
Why perform SEM micrographic analysis?
Firstly, micrographic examination can be carried out to check the health of a metallic material (to verify whether its structure corresponds to that expected) but also during failure assessments.
The surface of the material can thus be studied by Scanning Electron Microscopy coupled to a microprobe (SEM-EDX) in order to identify the chemical nature of unknown precipitates and inclusions or to characterise the stacking of a surface treatment (in the context of electroplating for example).
Indeed, SEM-EDX is a microscopic analysis technique using a field effect gun (FEG). This technique produces very high resolution images of the surface of a sample (magnification of the order of *1000000).
In addition, the SEMs are coupled with EDX probes allowing for extremely accurate analysis of your materials. These SEM-EDX techniques are thus equipped with a signal detection in column 20 times more intense than that of a conventional Scanning Electron Microscope. Thus, the SEM-EDX allows non-destructive, accurate and fast observations and analyses of investigations.
Thus, the support of a laboratory equipped with SEM-EDX is essential for micrographic analysis.
FILAB supports you in your SEM micrographic analysis needs
To go further
- Extreme surface analysis
Surface analysis for medical devices
Surface analysis by X-ray tomography
- Characterisation of surface conditions
Analysis and Measurement of Specific Surface Area by BET
- Training in the SEM technique in the laboratory
The positive aspects of FILAB
A highly qualified team
Responsiveness in responding to and processing requests
A complete analytical park of 2100m²