SEM-STEM analysis in the laboratory
You wish to carry out an analysis by SEM-STEM
Why perform SEM-STEM analysis?
Firstly, SEM is a microscopic analysis technique using a field effect gun (FEG). This technique produces very high resolution images of the surface of a sample (magnification of the order of *1000000).
SEM-STEM allows non-destructive, precise and rapid observations and analysis of investigations. In addition, the presence of a STEM (Scanning Transmission Electron Microscopy) detector extends the imaging capabilities of the SEM by giving access to certain information such as the morphology and structure of metal parts normally only accessible in a Transmission Electron Microscope (TEM).
Thus, for example, within the framework of a material characterisation process in the laboratory, the expertise of a laboratory equipped with SEM-STEM is indispensable.
FILAB supports you in your SEM-STEM analysis needs
Through our three levels of services: analysis, expertise and R&D support, FILAB assists companies from all sectors in their SEM-STEM analysis needs. FILAB provides its customers with the know-how and experience of its team, as well as a 2100m² analytical park equipped with state-of-the-art equipment.
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