You wish to know the nature and the origin of a trace on your materials?
What is a “trace” on a material?
In materials science, a trace refers to any visible or microscopic mark, residue, or anomaly present on the surface or within the structure of a material. These traces can originate from various sources such as mechanical stress (shocks, friction), environmental exposure (corrosion, contamination), or manufacturing processes (coating defects, inclusions, chemical residues). They may appear as particles, stains, cracks, or deposits and can affect the performance, durability, or aesthetics of a product. Identifying the nature, composition, and origin of a trace is essential to understand potential defects, ensure quality control, and prevent recurring issues in production.
What is SEM?
SEM stands for scanning electron microscopy and is an electron microscopy technique.
SEM allows the analysis of a material by a fine beam of electrons that scans the surface of the material without destruction, even of the most electron sensitive materials.
This is possible thanks to electron-matter interactions. Indeed, it is the phenomenon that allows to produce high resolution images and thus, to determine the structure of the surface and the morphology of a material.
In addition, the SEM also provides qualitative and quantitative information on several types of materials including
- polymers
- glasses
- metals...
Why analyze your surface traces by scanning electron microscopy?
Several reasons can lead to carry out analysis on your products and materials in particular to determine the origin and the chemical nature of the traces on your materials.
Indeed, these traces can be of different origins such as shocks, coating failure…
Moreover, the analysis of traces by SEM makes it possible to check if they are on the surface or deeper, and if they reach the sub-layers of your materials. Moreover, some traces can appear on several of your batches, so the SEM analysis allows to determine the origin of the trace, its chemical nature, as well as its depth.
Therefore, the support of a laboratory specialized in trace analysis is a considerable asset in the improvement of your materials.
FILAB supports you in the analysis of trace elements in your products and materials
Through our three levels of services: analysis, expertise and R&D support, FILAB assists companies of all sectors and sizes.
Indeed, FILAB accompanies you in the analysis of traces by SEM and takes care of the various stages of realization.
With its high level of in-house expertise and diversified analytical equipment, FILAB can offer you solutions adapted to your needs.
go further
Characterization of particles and contamination in the laboratory
Characterization and identification of pollution (inclusion of particles in a material)
Analysis of surface treatments (chemical baths, galvanization, metallic coating...)
Analysis and study of aging on material by SEM
Our FAQ
Scanning Electron Microscopy (SEM) provides high-resolution images and detailed information about the surface morphology of a material. It allows precise localization of traces and, when coupled with EDS, enables the identification of their chemical composition.
SEM can be used to analyze various types of traces such as particles, inclusions, cracks, deposits, corrosion products, or coating defects. It is suitable for a wide range of materials including metals, polymers, ceramics, and glasses.
Yes, SEM analysis helps determine the origin of a contamination by identifying its morphology and chemical composition. This information can then be correlated with manufacturing processes or environmental conditions.
SEM is considered a non-destructive or minimally destructive technique. In most cases, the sample remains intact after analysis, especially when no specific preparation is required.
SEM mainly analyzes surface features, but it can also provide information about sub-surface layers depending on the sample preparation (cross-section analysis) and the depth of interaction of electrons.
Optical microscopy is useful for preliminary observations, but SEM offers much higher magnification and resolution. It also provides chemical information, which optical microscopy cannot deliver.
Trace analysis is recommended in cases of product defects, contamination issues, unexpected material behavior, or quality control investigations, especially when the origin of the problem is unknown.
To obtain a quote, you can contact our team via our contact form, by phone, or by email.
Simply tell us your requirements (type of material, desired analysis, applicable standards, urgency, quantity of samples, etc.). We will then send you a personalized technical and pricing proposal within 24-48 hours.
Turnaround times vary depending on the nature of the analysis and the complexity of the expert assessment project.
However, FILAB is committed to providing fast turnaround times tailored to your industrial constraints and urgent needs.
