Through our three levels of services: analysis, expertise and R&D support, FILAB assists companies of all sectors and sizes.
Indeed, FILAB accompanies you in the analysis of rouging phenomena and takes charge of the different stages of realization.
Thanks to its high level of in-house expertise and diversified analytical equipment, FILAB can offer you solutions tailored to your needs. Thus, our laboratory provides you with several analytical techniques:
- Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS). This method allows, to begin with, to obtain elementary and molecular information on the species present on the extreme surface of samples
- X-ray photoelectron spectroscopy (XPS/ESCA). This method allows then to determine the elemental chemical composition of a material on a depth of a few nanometers.
- Scanning Electron Microscopy (SEM/EDX). Finally, this method allows morphological observations and local semi-quantitative chemical analysis on the product