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Nano-indentation analysis with SEM in the laboratory
You wish to perform a nano-indentation analysis with SEM
What is nanoindentation?
Why perform nano-indentation analysis with SEM?
SEM-EDX is a microscopic analysis technique using a field effect gun (FEG). This technique produces very high resolution images of the surface of a sample (magnification of the order of *1000000).
In addition, the SEMs are coupled with EDX probes allowing for accurate analysis. These SEM-EDX techniques are thus equipped with a detection of signal in column 20 times more intense than that of a conventional Scanning Electron Microscope. Thus, SEM-EDX allows non-destructive, accurate and fast observation and analysis of the measurements required for nanoindentation analysis.
Thus, the support of a laboratory equipped with SEM-EDX is essential in the context of a need for analysis by nano-indentation.
FILAB supports you in your needs for nanoindentation analysis with SEM
to go further
- SEM EBSD analysis
- Cryo-MEB analysis
- Extreme surface analysis
- SEM-EDX analysis laboratory
- Atomic Force Microscopy (AFM) analysis
- Surface analysis for medical devices
The positive aspects of FILAB
A highly qualified team
Responsiveness in responding to and processing requests
A complete analytical park of 2100m²