You wish to carry out failure studies using X-ray Tomography
Laboratory failure studies
Failure studies, also known as failure analysis, are a scientific and technical procedure designed to identify the origin of a problem with a product, material or process. They are generally carried out after a fault, failure or malfunction has occurred, with the aim of understanding why it happened and how to prevent it from happening again.
Why use X-ray Tomography to study failures?
When a product malfunctions, defects or breaks during its lifetime or in production, rapid and accurate identification of the root cause is essential. In many cases, faults originate deep within the material, and conventional techniques are unable to identify them without damaging the sample.
Thanks to X-ray tomography, it is now possible to visualize the interior of materials or assemblies non-destructively, in 3D, and with very high resolution.
Why choose X-ray Tomography for your failure studies?
X-ray tomography is used to :
Assessing the spatial distribution of defects
Analyze without damaging the sample, which is crucial for high-value-added components
Create virtual cuts in the part, from any angle
Compare a compliant product with a faulty one
FILAB supports you in X-ray Tomography failure studies
Why choose FILAB for X-ray Tomography failure studies?
At FILAB, our approach to X-ray tomography failure studies is based on a combination of expertise, cutting-edge technology and responsiveness in the field.
We have state-of-the-art X-ray tomography equipment, capable of revealing the finest internal defects, even on complex or miniature parts.
Our analysis are carried out by a team of engineers specialized in 3D data interpretation, able to relate observations to your industrial reality.
We also provide cross-disciplinary expertise on materials, manufacturing processes and application conditions, to put each defect into its global context.
Finally, our organization enables us to act quickly, especially when you are faced with an emergency in the field: production stoppage, critical non-conformity, customer dispute…
Our other technical resources for failure analysis
The FILAB laboratory provides manufacturers with a range of technical resources and state-of-the-art analytical equipment to complement the failure studies to be carried out:
SEM
Gas Chromatography
ICP
TFIR
DSC
XRD
Field Effect Scanning Electron Microscopy coupled with a microprobe (SEM-EDX analysis for topographic and chemical surface characterization)
Gas chromatography coupled with a mass spectrometer detector (GC-MS for the identification and quantification of organic molecules that can be chromatographed)
Plasma Emission Spectrometry (ICP-AES - ICP-MS for elemental chemical analysis and pollution identification)
FAQ
X-ray tomography is a non-destructive imaging technique that provides a 3D reconstruction of an object's interior. It works like a medical scanner, but with much higher resolution, suitable for industrial materials and components.
It enables internal defects to be located and characterized without having to cut or dismantle the part. This is particularly useful for analyzing faults in complex, fragile or expensive components, without damaging them.
X-ray Tomography can be adapted to a wide variety of materials: metals, polymers, ceramics, composites and more. It is particularly effective on injected, molded, machined or assembled parts, in sectors such as medical, aeronautics, automotive, luxury goods or electronics.
No, that's the whole point of X-ray tomography: it enables non-destructive analysis. The part remains intact, which is ideal when it is precious, unique or difficult to reproduce.
Yes, and it's even recommended. In the filab laboratory, we often combine X-ray tomography with other techniques (SEM, EDS, DRX, FTIR...) to cross-reference data and trace the root cause of failure more effectively.
