Your needs: controlling a product's surface cleanliness level
Why analyze surface cleanliness with SEM?
For many application sectors (medical, aerospace, automotive, electronics, etc.), a product’s functionality is directly linked to its surface.
Indeed, the presence of chemical contamination or particulate contamination on the surface following the various stages of the manufacturing process can affect a material’s characteristics.
Thus, to guarantee a product’s surface cleanliness and therefore its quality, it is essential to implement a cleaning program specific to the substances involved in the manufacture of the item.
In addition, the preferred technique for assessing surface cleanliness is Scanning Electron Microscopy (SEM-FEG) coupled with an EDX microprobe.
This approach has the advantage of making it possible to map the spatial distribution of contaminants on the part’s surface.
FILAB provides you with state-of-the-art SEM-FEG-EDX equipment to assess your surface cleanliness
From analysis to R&D, including expertise and validation of cleaning processes, the FILAB laboratory offers multisector expertise for several types of requests related to the surface cleanliness of materials:
Our expertise
Particulate and chemical mapping by SEM-FEG-EDX of the surface of aerospace components (metallic and ceramic) using a client methodology transferred and validated within our laboratory
Analysis of particulate cleanliness of turned parts intended for the aerospace and automotive sectors in accordance with ISO 16232 and VDA19
Particulate contamination in injectable products and parenteral infusions (USP 788, PE 2.9.19 method 2, etc.)
Analysis and control of gravimetry (according to NF E 48-652)
Particle counting according to E-48-660 and ISO 4406 standards
Surface condition control by SEM-FEG-EDX of dental implants after treatment to search for organic contamination and surface treatment residues such as shot blasting, sandblasting, etc. (Clean Implant)
Particulate contamination and chemical characterization of medical devices according to ISO 10993, ISO 19227
Identification of the nature of particles by SEM-FEG-EDX and FTIR microscopy in pharmaceutical-use solutions.
Identification of particles by SEM-EDX or MO according to NF E 48-651 and 48-660 standards
our other technical resources
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Chromatography Techniques (GC-FID, GCMS, LCMS, etc.)
