SEM-EDX
nvironmental scanning electron microscope (ESEM) coupled with energy-dispersive x-ray microanalysis (EDX)
High vacuum and low vacuum modes for conductive and insulating samples – Secondary and backscattered electron detector (topographic and chemical contrast) – EDX semi-quantitative chemical analysis (point mode, mapping, detection of elements from boron)
Optical microscope
optical miscroscope
The filab advantages
A highly qualified team
Responsiveness in responding to and processing requests
A COFRAC ISO 17025 accredited laboratory
(Staves available on www.cofrac.com - Accreditation number: 1-1793)
A complete analytical park of 5,200m²
Tailor-made support
