Our surface characterisation and failure analysis equipment


nvironmental scanning electron microscope (ESEM) coupled with energy-dispersive x-ray microanalysis (EDX)


High vacuum and low vacuum modes for conductive and insulating samples – Secondary and backscattered electron detector (topographic and chemical contrast) – EDX semi-quantitative chemical analysis (point mode, mapping, detection of elements from boron)

Optical microscope

optical miscroscope

Thomas GAUTIER Head of Materials Department
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