Micrographic analysis by SEM in the laboratory

Firstly, micrographic examination can be carried out to check the health of a metallic material (to verify whether its structure corresponds to that expected) but also during failure assessments.

The surface of the material can thus be studied by Scanning Electron Microscopy coupled to a microprobe (SEM-EDX) in order to identify the chemical nature of unknown precipitates and inclusions or to characterise the stacking of a surface treatment (in the context of electroplating for example).

Indeed, SEM-EDX is a microscopic analysis technique using a field effect gun (FEG). This technique produces very high resolution images of the surface of a sample (magnification of the order of *1000000).

In addition, the SEMs are coupled with EDX probes allowing for extremely accurate analysis of your materials. These SEM-EDX techniques are thus equipped with a signal detection in column 20 times more intense than that of a conventional Scanning Electron Microscope. Thus, the SEM-EDX allows non-destructive, accurate and fast observations and analysis of investigations.  

Thus, the support of a laboratory equipped with SEM-EDX is essential for micrographic analysis.