MET analysis laboratory

Your needs: analyze the structure of your metal parts

What is the MET technique?

TEM stands for Transmission Electron Microscopy. It allows a morphological, structural and chemical analysis of solid samples such as metal parts. The principle of TEM analysis is based on the interaction of electrons with matter. Like the SEM technique, it is a standard imaging technique for the analysis of semiconductor devices.

Why analyze your metal parts by TEM?

The TEM technique allows the analysis of the morphology and structure of metal parts. It is therefore particularly useful for quality control and failure analysis procedures such as

  • Characterization of a metal alloy
  • Fractographic analysis of a metal part
  • Morphological study of a metal part
  • Characterization of the composition of a part

Our solutions: FILAB helps you analyze the structure of your metal parts

Our specialized engineers and PhD students offer you their incomparable know-how for the analysis of metal parts by TEM. They accompany you at each step of the TEM analysis process in order to propose sustainable corrective solutions adapted to your world.

The positive aspects of FILAB

  • A highly qualified team

  • Responsiveness in responding to and processing requests

  • A complete analytical park of 2100m²

  • Tailor-made support

Thomas ROUSSEAU Scientific and Technical Director
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