TEM analysis laboratory
Your needs: analyze the structure of your material
Transmission electron microscopy (TEM) is a microscopy technique where a beam of electrons is “transmitted” through a very thin sample.
What is the TEM technique?
TEM stands for Transmission Electron Microscopy. It allows a morphological, structural and chemical analysis of solid samples such as metal parts. The principle of TEM analysis is based on the interaction of electrons with matter. Like the SEM technique, it is a standard imaging technique for the analysis of semiconductor devices.
Why analyze your metal parts by TEM?
The TEM technique allows the analysis of the morphology and structure of metal parts. It is therefore particularly useful for quality control and failure analysis procedures such as
- Characterization of a metal alloy
- Fractographic analysis of a metal part
- Morphological study of a metal part
- Characterization of the composition of a part
What type of sample can be analyzed by TEM?
With the transmission electron microscope (TEM), a wide variety of samples can be observed, coming from various scientific and industrial fields. Here are the main categories of samples that can be analyzed using this technique:
Industrial Materials
Nanomaterials
Our solutions: FILAB helps you analyze the structure of your material
Why choose FILAB for TEM analysis?
Our specialized engineers and PhD students offer you their incomparable know-how for the analysis of metal parts by TEM. They accompany you at each step of the TEM and cryo-TEM analysis process in order to propose sustainable corrective solutions adapted to your world.
The purpose of TEM analysis is to examine samples at very high magnification and allow scientists and researchers to observe extremely small objects. It is used to study the microstructure of materials, examine particle size and shape, analyse surfaces or interfaces, perform failure analysis, characterise nanomaterials, and much more. TEM analysis can be used to analyse a wide variety of samples such as metals, alloys, ceramics, semiconductors, organic polymeric materials, proteins and other biological substances. With its high resolution capabilities and its ability to gather valuable information in a relatively short time, it has become an invaluable tool for the scientific community. With TEM analysis comes the responsibility to ensure that the sample is handled correctly and that proper safety protocols are followed. For this reason, it is important to have a competent and experienced operator perform the TEM analysis.
By performing a detailed visual inspection under high magnification, TEM analysis can provide information about the structure and composition of materials that cannot be obtained by other methods. It offers an unparalleled level of detail that allows the detection of microstructural defects such as discontinuities, inclusions or voids. Thanks to its increased resolution capabilities compared to optical microscopy, researchers are now able to characterise nanostructures with unprecedented precision.
TEM analysis can be used in a wide range of industries, including electronics, biotechnology, automotive and aerospace. It is also widely used by research laboratories to study materials for potential applications. By providing valuable information on microstructure and composition, TEM analysis can help inform product development decisions that can improve performance or reduce costs.
TEM analysis offers researchers and industry a powerful tool for the detailed examination of samples at very high magnification. With its ability to characterise nanostructures accurately and quickly, it has become an invaluable tool for a range of industries and applications. To ensure safe operation of the microscope and to obtain accurate results, it is essential that TEM analysis is performed by an experienced operator.
- SEM is ideal for analyzing surfaces, observing morphology and obtaining an overview of the sample.
- TEM is essential for exploring internal structures at the nanometric or atomic scale, looking for exceptional details and resolution.
The two techniques are complementary: one can start with a SEM analysis to characterize the surface and refine the analysis with a TEM to study the internal structure.
