Thickness measurement by SEM in laboratory

To begin with, scanning electron microscopy is an electron microscopy technique. This method allows the analysis of a material by a fine beam of electrons that scans the surface of the material without destruction. Thus, at the end of this analysis, several information can be obtained in particular, the thickness of the various layers.

The measurement of the thickness of the different layers of a material by SEM, allows you, first of all, to check and adapt your manufacturing processes. Indeed, the SEM, by the quality of the image obtained at the end of the analysis, makes possible the meticulous observation of the various layers.

In addition, electron microscopy also allows you to adapt the implementation of surface treatment or cleaning processes.