Atomic Force Microscopy (AFM) Laboratory
AFM, or Atomic Force Microscopy, is an advanced analysis technique for exploring and understanding the properties of surfaces at the nanoscale. With advanced precision, it offers ideal resolution for characterizing topographical and mechanical details of materials. At FILAB, we put this cutting-edge expertise at your service to meet your surface analysis needs.
What is Atomic Force Microscopy (AFM)?
The Atomic Force Microscope (AFM) is a microscope with a local probe, high resolution to visualize the topography of the surface of a sample but also the tribology, the mechanical, electrical or chemical behavior.
This method allows to analyze point by point the surface of the sample thanks to the scanning of a probe made of a nanometric tip. This microscope thus offers the possibility of studying objects on a very small scale.
Indeed, the very principle of microscopic study is to rely on light. However, once in the universe of the infinitely small (less than a few hundred nanometers), the observation conditioned to light becomes impossible since the limit of resolution is about 100µm. AFM allows to overcome these limits since this type of microscopy works by measuring the attractive or repulsive interactions between the tip of the AFM and the surface of the sample. The resolution of the AFM is 1Å or 0.1 nm laterally and vertically.
The FILAB laboratory has cutting-edge AFM equipment for the analysis of surfaces and in particular the characterization of nanomaterials.
FILAB laboratory analysis the surfaces of your samples by AFM
The FILAB laboratory specializing in surface analysis provides you with a cutting-edge technique: AFM (Atomic Force Microscopy). This technique allows a fine and precise analysis of the surfaces of your samples, revealing details invisible to the naked eye. Using AFM, we are able to detect and analyze minute differences in topography on a surface, as well as the associated physical properties.
Depending on the physicochemical parameters sought, several AFM configurations can be used:
- AFM : to characterize all types of materials, to measure roughness parameters, elasticity, adhesion, friction, and surface energy properties…
- The SMM : ‘Scanning Microwave microscopy’ is an AFM coupled with microwave spectroscopy. The tip serves as a local microwave (gigahertz) transmitter and receiver, it allows a non-destructive topographic and tomographic analysis while keeping the essential property of the AFM: the nanometric resolution. MMS allows to characterize all types of materials, to measure microstructural changes, to identify the presence of buried defects, to measure sub-surface mechanical stresses, to determine diffusion profiles of light elements (oxygen, nitrogen and even hydrogen!) while being non-destructive… It’s a revolution!
- The UA-AFM is an AFM coupled with acoustic spectroscopy. Based on the same principle as ultrasound, it allows tomography at the nanometric and micrometric scales to characterize all types of materials while being non-destructive like MMS. Sensitive to density variation, it allows to reconstruct in 3d the first micrometers of a surface to identify inclusions, defects that can be a source of corrosion or breakage…
- IR-AFM: is an AFM coupled with infrared spectroscopy. This technique based on the photothermal effect induced by laser illumination allows to obtain a chemical mapping of the surface with a nanometric resolution.
Example of benefits by AFM
Search for conductivity or electrical permittivity defects (semiconductor)
Thickness measurement of a non-destructive deposit on the surface of a part
Diffusion profile of light elements (oxygen, nitrogen, hydrogen...) in non destructive mode (equivalent to NRA)
Search for buried defects (inclusions, crystallization defects,)
Tomography with nanometric resolution
Local mechanical measurement in the context of a non-conformity or part inspection
Checking the homogeneity of a deposit or a surface functionalization
Example of services by AFM
Search for mechanical constraints that could be the cause of a fracture
Search for conductivity or electrical permittivity defects (semiconductor)
Measurement of non-destructive deposit thickness on the surface of a part
Profil de diffusion d’éléments légers (oxygène, azote, hydrogène…) en mode non destructif (équivalent à la NRA)
Characterization of nanostructures by AFM measurement
Comparative study of AFM vs SEM surface
Search for buried defects (inclusions, crystallization defects, etc.)
Tomography with nanometer resolution
Local mechanical measurement in the context of non-compliance or part inspection
Verification of the homogeneity of a deposit or surface functionalization
Characterization of surface properties
The AFM microscope, cutting-edge equipment
Industry is a field that requires flawless precision. This is why the power of an AFM microscope is necessary for certain industrial applications. Indeed, visualizing structures at the nanoscale can be used to inspect materials, identify surface defects, and even understand how individual molecules interact.
The advantages of analysis by AFM (Atomic Force Microscopy)
The advantages of an AFM microscope are numerous. This type of microscope allows more precise visualization of surfaces at the nanoscale, thus providing better analysis of the structure of the material.
Additionally, AFM also allows measuring surface forces such as adhesion or repulsion force, a parameter often considered in the manufacturing or development of new materials.
The different types of probes that can be used on the AFM
Contact mode
One of the common operating techniques of AFM that provides high-resolution images of the surface topography of a sample. In this mode, the cantilever point is in constant contact with the sample.
Tapping mode
Also known as intermittent contact mode. In this mode the cantilever tip does not come into contact with the sample. The tip is oscillated near its resonant frequency and scans the sample surface with a constant amplitude. The force variations recorded are used to create a topographic image of the surface under study.
Peak Force Tapping Mode and QNM
These two application modes are advanced AFM techniques. They combine the advantages of force spectroscopy and tapping. The cantilever tip does not come into contact with the sample, it is set in modulated oscillation at a lower frequency than in the traditional tapping mode. The force exerted on the sample is measured at each scanning point, thus allowing the mapping of the mechanical properties of the surface at the nanometric scale.
The QNM mode extends this analysis by allowing a quantitative mapping of the observed mechanical properties.
Mode c-AFM (Conductive Atomic Force Microscopy)
With this mode of application of AFM it is possible to map the electrical conductivity of the surface of materials at the nanometric scale. A small electric current diffused in the tip of the cantilever scans the surface of the sample and at each point the electrical conductivity is measured.
Mode Scanning Capitance Microscopy
It allows mapping of electrical capacitance variations at the nanoscale on the surface of a sample. A probe tip is placed close to the surface of a sample, forming a capacitor. Electrical capacitance is measured by applying an alternating voltage to the tip and measuring the resulting alternating current.
Mode Scanning Spreading Resistance Microscopy
This technique measures and maps electrical resistance variations at the nanoscale on the surface of a sample. A conductive probe tip is placed on the surface of a sample. The electrical resistance is measured as a function of the voltage applied as the tip scans the sample.
Traction module
It allows the study of cracking or deformation of the surface of a coating.
FAQ
In surface analysis, performing an AFM is essential to:
1/ Characterize surface topography: Identify roughness, irregularities or specific structures of a surface with nanometric precision.
2/ Study surface interactions: Measure forces such as adhesion, friction or local mechanical interactions, essential in many scientific and technical contexts.
3/ Analyze material quality: Detect defects or anomalies, optimize manufacturing processes, or evaluate the performance and durability of materials.
4/ Explore samples non-destructively: AFM is a non-invasive method that preserves the integrity of samples while providing in-depth analysis.
AFM is a technical solution to understand the physical, mechanical or topographical properties of a surface for research, development or quality control purposes.
AFM is used to characterize surfaces at the nanoscale. In industry, this analysis technique is used to:
- Assess the roughness of materials (e.g. electronics, coatings, composite materials).
- Analyze surface defects and identify their origin (e.g. microcracks in mechanical parts).
- Control the uniformity of coatings or thin layers (e.g. optics, solar energy).
- Test the quality of interfaces in multi-material assemblies.
AFM identifies potential failures related to surface irregularities, unwanted particles or nanoscale structural changes. This allows manufacturing or processing processes to be adjusted to improve reliability.
AFM can analyze a wide range of matrices, including:
- Metals and alloys (analysis of oxidations or surface treatments).
- Polymers (characterization of textures or local mechanical behaviors).
- Semiconductors (verification of etchings and doping layers).
- Biomaterials or biological molecules (for the pharmaceutical or medical sectors).
Yes, AFM is particularly effective on non-flat surfaces thanks to its contact or oscillation scanning mode. However, for very marked reliefs, specific adjustments of the scanning parameters are necessary.
AFM is often used in addition to:
- Scanning electron microscopy (SEM): for visualization of 3D structures and local chemical analysis (EDX).
- Infrared or Raman spectroscopy: to identify chemical bonds on the surface.
- X-ray diffraction (XRD): to study crystallinity.
AFM is particularly recommended for materials analysis when:
- Nanometric resolution is required for surface characterization.
- Samples are sensitive and do not tolerate vacuum (unlike SEM).
- A quantitative analysis of surface forces is necessary (e.g. adhesion, friction).
AFM can detect nanoscale defects, such as early cracks or thickness variations, allowing the causes of failure to be identified (application problem, insufficient adhesion, contamination).
Yes, AFM measures topographic and mechanical changes due to heat treatment, such as roughness variations or local structural alterations.
