SEM EDX analysis laboratory
You would like to carry out SEM EDX analysis in a laboratory ?
The principles of SEM-EDX analysis
SEM EDX analysis combines Scanning Electron Microscopy (SEM) to provide high-resolution images of sample surfaces with Energy Dispersive X-ray Spectroscopy (EDX) to identify and quantify elemental compositions. When the sample is bombarded with an electron beam in SEM, it emits characteristic X-rays detected by EDX, allowing for simultaneous morphological and chemical analysis at micro to nanoscales. This integration provides crucial insights into the material properties required for advanced scientific and industrial applications.
What is EDX analysis used for ?
Performing an EDX analysis is valuable for several reasons :
> Elemental Composition: EDX offers precise elemental identification and quantification, crucial for verifying material specifications and detecting impurities.
> Material Characterization: It helps in characterizing material properties for research and development, ensuring materials meet necessary standards.
> Non-destructive Analysis: EDX is a non-destructive technique, allowing for the analysis of delicate samples without altering their structure.
> Localized Analysis: It can target very small areas of a sample, useful for investigating microstructures or defects.
> Versatility: EDX is applicable across diverse fields, from electronics and metallurgy to environmental science and archaeology, making it a versatile tool for both industrial and research purposes.
Why perform an SEM EDX analysis?
The combination of SEM images and EDX data provides a wealth of information on the sample, from material characterization to failure analysis. The results can reveal information on crystal structure, phase composition, elemental distribution and other important properties of the samples studied, in the context of chemical analysis.
Our Scanning Electron Microscopy SEM EDX analysis solutions in the laboratory.
Today, FILAB is one of the first laboratories in France to equip itself with 2 Zeiss SEM-EDX techniques, model GEMINI SEM. This SEM microscopic analysis tool is particularly powerful and efficient for rapid diagnosis (pollution, inclusion…) or more complex appraisals.
What exactly is Scanning electron microscopy ?
Scanning Electron Microscopy (SEM-EDX) is an analytical technique which uses a Field Emission Gun (FEG) and produces high resolution images of a sample’s surface (1 000 000x zoom)
This new SEM-EDX with column signal detection 20 times more powerful than a conventional Scanning Electron Microscope allows FILAB to carry out analysis with high added value and to get much clearer images for fast, non-destructive and accurate observations and investigations.
The FILAB analytical laboratory is today one of the first French laboratories to own a Zeiss GEMINI SEM microscope. This analytical tool is particularly powerful and efficient for rapidly diagnosing pollutants or for performing more complex expertise.
Our technical resources: SEM EDX (SEM-FEG or Tungsten SEM)
In the FILAB laboratory, SEM-EDX is the primary diagnostic tool. This is why we have chosen to integrate the following into our analytical equipment:
> A FEG-SEM coupled to an EDX probe for materials failure assessment (metals, polymers, ceramics, glass, etc.) and R&D.
> A Tungsten SEM coupled with an EDX probe for identification of particles, contaminants, deposits and pollution.
The advantages of SEM EDX
The SEM enables very precise study of different surfaces thanks to ultra-high-definition image resolution.
- A Variable Pressure (VP) mode for non-destructive analysis of all types of materials (without metallization).
- A sensitive, high-speed 80 mm² energy dispersive microprobe (EDS) for semi-quantitative chemical analysis and mapping, including for the analysis of all types of materials.
- An In-Lens detector for very high resolution images of the order of 1 nm at acceleration voltages of around 1 kV
- A transfer airlock for fast, clean introduction of “large” samples light elements
Our expertise in SEM EDX and SEM FEG
Our SEM-EDX expertise is fundamental to our analytical approach. At FILAB, our team of experts uses SEM EDX analysis to address complex analytical challenges, providing our customers with reliable, high-quality results on a variety of performance types:
Our services analysis with SEM EDX
Industrial sectors of application of the MEB-EDX technique :
Luxury goods (Jewelry, Horology, Leathercraft…)
Other technical resources: SEM and analytical coupling
The FILAB laboratory has a range of technical resources for chemical analysis. Analytical coupling of SEM (Scanning Electron Microscope) with other analytical methods, such as SEM-EDX, provides detailed information on the chemical composition, crystal structure and morphological properties of the samples observed. In this way, coupled SEM offers comprehensive characterization on a microscopic scale.
SEM-EDX analysis is a microscopy technique used for imaging and analysis of elements and chemical composition. This technique combines scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX). SEM-EDX analysis allows the surface structure and chemical composition of materials to be observed at high magnifications. The combination of these two techniques allows a detailed study of individual particles and surface characteristics of the material, which can be as small as 1 nanometre. The analytical information obtained from this analysis can provide valuable insights into the properties and characteristics of the sample in question. In addition, it can be used to identify contaminants or other impurities that may be present in trace amounts. SEM-EDX analysis is often used in a wide variety of applications, including materials science and forensic analysis. With this advanced technique, researchers can obtain precise information about the chemical composition of samples on a very small scale.
The SEM EDX analysis process begins by placing the sample in the chamber of an electron microscope. The electrons emitted from the sample then pass through an energy filter to produce secondary X-rays which are detected by the EDX detector. The energy dispersed X-ray data is then analysed to determine the composition and concentration of elements present in the sample. This analysis can provide accurate results on particle size distribution, crystal structures, oxidation states and other characteristics of individual particles.
SEM-EDX analysis is used in a wide range of industries including materials science, aerospace engineering, medical research, electronics manufacturing, environmental studies and forensic analysis. SEM analysis can be used to analyse and identify contaminants or other trace impurities in materials and components. It can also help researchers to better understand the surface characteristics of materials, such as particles or nanoscale structures. In addition, SEM-EDX analysis can provide valuable information on the composition and concentration of elements present in samples for a variety of applications. In addition, this microscopy technique has been successfully used by the pharmaceutical industry to detect active ingredients in drug samples with high accuracy.
EDX analysis (Energy dispersive X-ray (EDX) analysis) or EDX-analyse is performed using an EDX probe. This is a spectroscopic instrument, using X-rays to explore the chemical properties of elements present in a material. Combined with other complex material failure analysis techniques, EDX probes help analysts to understand the cause of material deterioration, and to develop appropriate solutions to prevent such material failures. Laboratories such as FILAB offer in-depth material failure analysis using EDX analysis equipment..
The EDX probe or EDX detector receives photons emitted by the material following electronic excitation by a special device. The EDX probe then measures the energy generated by the material. Each chemical element has a characteristic energy value, making it possible to identify the elements contained in the material.
Based on physico-chemical detection, an EDX probe is a laboratory tool for analyzing different types of materials. The materials that can be analyzed with an EDX probe are varied, from steel to polymers to metal alloys, but also glass, powder …
Recourse to this analysis is made following various problems: identify material family, metal microstructure, powder morphology or explore surface coating or defects, pollution, corrosion, material cracking…
This technology is very useful for characterizing the properties of materials, for example, to determine their composition, purity or concentration of specific elements. It is therefore the tool of choice in our laboratory for accurate and reliable analysis of materials.
SEM-EDX analysis can provide several types of information relating to materials and surface characterization :
- Imaging: scanning electronic microscope provides detailed images of the sample surface, revealing its topography and structure on a microscopic scale.
- Elemental composition: Energy Dispersive X-ray Spectroscopy (EDX-analyse)determines the chemical elements present in the sample, and their relative quantities. This makes it possible to identify the constituent elements of a material, or to detect the presence of specific elements.
- Elemental mapping: SEM-EDX analysis can also generate elemental distribution maps in the sample, enabling the spatial distribution of chemical elements to be visualized.
EDX stands for Energy Dispersive X-ray Spectroscopy. It's a technique used for elemental analysis or chemical characterization of a sample.
EDX analysis is a technique used to determine the elemental composition of materials. By measuring X-rays emitted from a sample when bombarded by electrons, EDX identifies and quantifies the elements present. This analysis is essential for research and quality control across various scientific and industrial fields.
What are the differences between SEM EDX and EDX in terms of analysis ?
SEM-EDX combines the high-resolution imaging capabilities of Scanning Electron Microscopy (SEM) with the elemental analysis provided by Energy Dispersive X-ray Spectroscopy (EDX).
SEM focuses on generating detailed images of material surfaces up to the nanometer scale, revealing texture and morphology, while EDX characterizes the elemental composition by analyzing the X-rays emitted from the material when bombarded with electrons.
Together, SEM-EDX offers a powerful tool for simultaneously understanding both the physical structure and chemical properties of materials, important for fields like materials science and semiconductor research.
EDX analysis is a method used for identifying and quantifying the elemental composition of materials. It is applicable to a broad range of samples and materials, including:
> Metals and Alloys: EDX can determine the elemental makeup of metallic samples, useful in metallurgy for quality control, alloy development, and failure analysis.
> Semiconductors and Electronic Components: It helps in the analysis of materials used in electronic and photonic devices, checking for impurities or composition accuracy.
> Biological Samples: In biology and medicine, EDX can be used to study the distribution of elements within tissues, cells, or bioengineered materials, often to understand physiological processes or disease mechanisms.
> Polymers and Plastics: EDX can also be used to analyze the presence of additives or contaminants in synthetic materials.
> Ceramics and Glasses: Analyzing ceramic materials or glass to determine their elemental composition, which is critical for understanding their properties and performance.
> Environmental Samples: EDX can analyze particles collected from air or water samples to identify pollution sources or environmental contaminants.
EDX is particularly valued for its non-destructive nature and its ability to perform localized analysis, providing elemental data from very small areas (micrometer scale), which is essential for materials research and quality control across these diverse fields.
