You want to measure the thickness of the surface treatment by SEM?
To begin with, scanning electron microscopy is an electron microscopy technique. This method allows the analysis of a material by a fine beam of electrons that scans the surface of the material without destruction. Thus, at the end of this analysis, several information can be obtained in particular, the thickness of the various layers.
The measurement of the thickness of the different layers of a material by SEM, allows you, first of all, to check and adapt your manufacturing processes. Indeed, the SEM, by the quality of the image obtained at the end of the analysis, makes possible the meticulous observation of the various layers.
In addition, electron microscopy also allows you to adapt the implementation of surface treatment or cleaning processes.
FILAB assists you in the measurement of thickness by SEM on all types of materials
Through our three levels of services: analysis, expertise and R&D support, FILAB assists companies of all sectors in the analysis of material contamination by SEM. For this purpose, FILAB provides its customers with the know-how and experience of its team as well as a 2100m² analytical park with state-of-the-art equipment.
In addition, FILAB has significant experience in the measurement of layer thickness by SEM and the development of specific methods.
Example of services
Analysis of the chemical composition of the surface by SEM-FEG-EDX, XPS or TOF-SIMS
Morphological study of the surface of a material (porosity, roughness,...) by SEM-FEG-EDX
Identification of surface pollution (analysis of particles, deposits,...) by SEM-FEG-EDX
Study of failures and surface defects by SEM-FEG-EDX (crack, rupture, migration, corrosion...)
