XPS / ESCA analysis in a laboratory
As a manufacturer, are you looking for an XPS / ESCA analysis laboratory to characterise a surface?
XPS/ESCA analysis: what are we talking about?
XPS is an elemental analysis technique. XPS and ESCA refer to the same technique; XPS is the scientific name, ESCA a descriptive and historical name.
XPS (X-ray photoelectron spectroscopy) or ESCA (electron spectroscopy for chemical analysis) is a surface analysis technique that can be used to determine the elemental and chemical composition and oxidation states of elements present on the surface of a material.
X-ray Photoelectron Spectroscopy (XPS) is an analytical tool. It can be used to determine the elemental chemical composition of a material to a depth of just a few nanometres. XPS is also more historically known as ESCA for Electron Spectroscopy for Chemical Analysis.
Why carry out an XPS analysis in the laboratory?
Whatever your industrial sector, XPS analysis and characterisation can meet all your surface analysis needs:
XPS assessment of the conformity of a surface treatment applied to an alloy to provide protection against oxidation (passivation, anodising, etc.)
Identification of the nature of a deposit or pollution observed on the surface of a material by XPS (elemental diagnosis and chemical forms present)
XPS analysis as part of new product development. For which the nature and chemical functionalisation of the surface is strategic (surface used in assembly by bonding, surface treatment providing resistance to corrosion, wear, abrasion, etc.)
These surface analysis tests enable you to ensure the conformity of your products and respond to your industrial problems of failures (corrosion, discolouration, etc.) and the identification of pollution.
Our solutions: propose xps analysis techniques specific to your requirements and determine the surface chemical composition of your sample
XPS analysis, an advanced technical ressource
XPS (or ESCA) spectroscopy is a non-destructive method of analysis
XPS (X-ray Photoelectron Spectroscopy) is specifically designed to probe the very first atomic layers of a material, typically between 3 and 10 nanometres deep. This is known as extreme surface analysis.
By irradiating the surface with X-rays and analysing the photoelectrons emitted, it reveals not only which elements are present, but also the nature of their chemical bonds (oxidised forms, valence states, bond types, etc.).
Often combined with other techniques such as AFM or transmission electron microscopy (TEM), XPS characterisation provides a detailed and comprehensive view of the surface of materials, essential for R&D, quality control and failure analysis.
Our XPS analysis services
FILAB is an interdisciplinary laboratory offering analysis services, some of which are COFRAC ISO 17025 accredited:
Analysis of surface chemical composition
Characterization of the elemental chemical composition of extreme surfaces
Elemental and chemical environment identification by XPS
Elemental analysis of all elements starting with Li
Qualitative and quantitative analysis (relative error 10%)
Surface analysis (depth analysed 5-10 nm)
Analysis of conductive or insulating materials
Determination of oxides present
Analysis by XPS spectroscopy
Validation and control of surface treatments
Validation of the integrity of a surface treatment or surface functionalisation
Validate a surface treatment process (anodising, passivation, etc.)
Passivation process optimisation as part of a development project
Checking the condition of deformed areas
Expertise and fault diagnosis
Assessment of faults (corrosion, appearance of stains, observation of discolouration, etc.)
Identifying the source of a corrosion problem
Comparative expertise on PTFE (apparent black spots)
Trace analysis on syringes
Studies and characterization of materials
Characterization of a stack of nano or micrometric layers
Microstructure investigations
XPS characterization on your matrices
Industrial applications of XPS technology
- Study of the surface state and surface layers of materials, for applications where surface properties play a key role, such as in coatings and interfaces in electronic devices.
- Assessment of the effectiveness of surface treatments, related to cleaning, corrosion, passivation or improving adhesion. It is used to check the presence and uniformity of functional layers or coatings applied to a substrate.
- Determining the composition of alloys and inorganic or organic compounds, providing quantitative information on the relative concentration of the different elements present.
- By analysing changes in XPS spectra before and after chemical reactions, heat treatments or other processes, the laboratory may be able to obtain valuable information about the chemical modifications undergone by the surface.
Les trois modes de fonctionnement de l'XPS
More information
Spectroscopy mode
Imagery mode
Profile mode
FAQ
XPS analysis works by irradiating the sample with X-rays, causing electrons to be ejected from its surface. The ejected electrons are then analyzed in terms of kinetic energy to determine the chemical elements present and their oxidation states.
XPS analysis is applicable to a wide range of materials, including metals, semiconductors, polymers, ceramics and composites. Samples must be solid and stable under vacuum.
XPS analysis offers advantages such as high chemical sensitivity, the ability to analyze surfaces non-destructively, the possibility of quantitative analysis and the detection of chemical species present on the surface.
Limitations of XPS analysis include the need to prepare solid samples, the inability to analyze thick layers of materials, the influence of surface properties on results, and the complexity of data interpretation.
A typical XPS analysis involves sample preparation, introduction of the sample into a vacuum chamber, irradiation with X-rays, collection of the ejected electrons, their analysis in terms of kinetic energy and interpretation of the data obtained.
XPS analysis is widely used in many fields, such as materials science, electronics, catalysis, corrosion, nanotechnology, surface biology and coatings research.
XPS analysis uses X-rays, so it is essential to follow appropriate safety measures, including wearing personal protective equipment, following sample handling procedures and avoiding unnecessary exposure to X-rays.
XPS (X-ray Photoelectron Spectroscopy) analysis, also known as X-ray photoelectron spectroscopy, uses different equipment to carry out measurements and analysis. The following equipment is commonly used for XPS analysis:
- X-ray source: A piece of equipment generates X-rays, usually using an aluminium or magnesium anode. The X-rays emitted interact with the sample and cause electrons to be ejected from its surface.
- Vacuum chamber : XPS analysis is carried out in a vacuum chamber to avoid contamination of the sample by molecules or particles in the air. A high vacuum pressure is maintained inside the chamber during analysis.
- Photoelectron spectrum analyser: An analyser is used to measure the energies of electrons ejected from the sample as a result of interaction with X-rays. The most commonly used analysers are hemisphere energy analysers (HSA) and cylinder energy analysers (CSA).
- Detector: A detector is used to measure the number of electrons ejected at different energies. The most commonly used detectors are electron multiplier detectors (SEM) and microchannel anode detectors (MCP).
- Sample: The sample is placed in the vacuum chamber and exposed to X-rays. It may be a solid material or a surface. The sample can be prepared by cleaning, polishing or fracturing, depending on the nature of the analysis required.
- Data acquisition and control system : A control and data acquisition system is used to control equipment, collect data and perform analysis. Specific software is used to process the data and interpret the spectra obtained.
This equipment is used in combination to carry out XPS measurements, which make it possible to analyse the chemical components present on the surface of the sample, their oxidation state and their distribution in depth.
XPS characterization and XPS analysis are common techniques in materials science and chemistry. Although both involve the use of photoelectron spectroscopy, there are some key differences. XPS characterization is used to determine the chemical elements present in a sample, their percentages and molecular structures. XPS analysis, on the other hand, is a more in-depth study of these elements, in particular the electron charge distribution.
Ultimately, XPS characterization is useful for identifying elements in a sample, while XPS analysis provides more detailed information about their electrical behaviour. By understanding these differences, researchers can make effective use of these techniques in their research.
XPS, or X-ray photoelectron spectroscopy, is a surface analysis technique widely used in materials science. It is used to study the chemical composition, electronic structure and interactions between atoms on the surface of different types of materials, such as metals, oxides, polymers and semiconductors. This method is based on the interaction between high-energy photons and electrons on the surface, which are then measured to provide valuable information about the properties of the materials. XPS characterisation is a non-destructive and highly sensitive technique that can be used for a variety of applications, from fundamental research to materials characterisation in industry.
