Laboratory characterization of nanomaterials by XPS

Your need: characterize nanomaterials by XPS in the laboratory.

Why characterize nanomaterials by XPS?

First of all, the technique of X-ray Photoelectron Spectroscopy (XPS) aims to determine the elemental chemical composition of a material on a depth of a few nanometers.

Indeed, the XPS consists in irradiating by a beam of X-rays the surface of a sample then to study the photoelectrons generated by the interaction between the incident beam and the material. It is then possible to determine the elemental chemical composition of the surface. For each detected element, its chemical environment (nature of chemical bonds, identification of oxidation degrees, …) is also determined.

Thus, in the context of nanomaterials, their characterization by XPS allows to determine in a qualitative or quantitative way their chemical composition as well as the nature of their chemical form. The determination of these properties is therefore a key step in the regulatory analysis required by the R-Nano regulation or the REACH regulation.

FILAB supports you in your needs for XPS characterization of nanomaterials

Through our three levels of services: analysis, expertise and R&D support, FILAB assists companies from all sectors in the characterization of nanomaterials by XPS. FILAB provides its customers with the know-how and experience of its team, as well as a 2100m² analytical park equipped with state-of-the-art equipment.

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The positive aspects of FILAB

  • A highly qualified team

  • Responsiveness in responding to and processing requests

  • A complete analytical park of 2100m²

  • Tailor-made support

Thomas GAUTIER Head of Materials Department
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