SEM-EBSD analysis laboratory
As a manufacturer, would you like to carry out an EBSD SEM analysis?
What is Scanning Electron Microscopy EBSD (SEM-EBSD)?
Scanning Electron Microscopy (SEM) coupled with Electron Backscatter Diffraction (EBSD) is a state-of-the-art technique used in the laboratory to analyze the crystalline microstructure of materials. This method combines the high-resolution imaging capability of SEM with the detailed analysis of crystal structure and texture via EBSD.
SEM-EBSD reveals precise information on crystal orientation, grain boundaries, crystalline phases and structural deformations. These data are important for understanding how microstructure influences the mechanical and physical properties of materials.
What is EBSD analysis?
EBSD (Electron BackScatter) is a backscattered electron diffraction imaging mode that can be combined with SEM. EBSD is a technique for analysing the internal structure of materials (microstructure).
> EBSD provides information on crystal orientation and grain structure at the micrometre and even nanometre scales, giving a detailed understanding of the microstructure.
> This technique can map the texture of a material, revealing how grains are oriented relative to each other, in order to understand the mechanical properties of materials.
> EBSD analysis can identify the different crystalline phases present in a sample and their distribution, which is essential for multiphase materials.
> EBSD can reveal the presence of crystalline deformations, dislocations and other structural defects, providing valuable information for materials engineering and materials science research.
Why carry out an EBSD SEM analysis in the laboratory?
Performing EBSD-MEB analysis in the laboratory helps to decipher the microstructure of materials, optimise manufacturing processes and ensure quality control in a variety of sectors.
This advanced analysis technique reveals precise details of grain size, orientation and grain boundaries, making it possible to improve material properties such as strength, ductility and reliability.
SEM EBSD analysis is also used in the development of new materials and the understanding of deformation and ageing mechanisms.
Our solutions: offer EBSD SEM analysis techniques specific to your requirements and determine the microstructure of your material
SEM EBSD analysis, a state-of-the-art technical tool
As a meb ebsd analysis laboratory, FILAB is now one of the first French laboratories to be equipped with the Zeiss GEMINI SEM… SEM-EDX-EBSD. This microscopic SEM analysis tool is particularly powerful and efficient for rapid diagnosis (pollution, inclusion, etc.) or more complex expert assessments.
The SEM EBSD analysis technique is based on the use of an incident electron beam of a few tens of kilovolts sweeping across the surface of the sample, which then re-emits a whole spectrum of particles and radiation: secondary electrons, backscattered electrons, Auger electrons or even X-rays.
The electron beam is produced in an ‘electron gun’ and then directed through a set of electromagnetic lenses and scanning coils that form the SEM column.
Our EBSD SEM analysis services
Inspecting for failure
Identification of particles, contaminants and deposits
Surface layer analysis
Nanometric characterization: FILAB is the first French laboratory to be COFRAC ISO 17025 accredited in this field
Surface analysis
Industrial applications of the meb ebsd analysis technique
Scanning Electron Microscopy-Electron Backscatter Diffraction (SEM-EBSD) has applications in a variety of industries thanks to its ability to provide detailed information on the microstructure of materials.
In the metallurgical industry, SEM-EBSD is used to analyse the structure of metal alloys, optimise heat treatments and understand deformation and fracture mechanisms. It helps to improve the quality and mechanical properties of finished products such as steel and aluminium.
In the microelectronics and semiconductor industries, this technique is used to examine crystallinity and defects in semiconductor materials such as silicon and germanium. EBSD analysis can be used to optimise manufacturing processes and improve the performance and reliability of electronic devices.
For composite materials, EBSD can be used to study the orientation of fibres and reinforcements in matrices, in order to design materials with optimised mechanical properties for specific applications, such as carbon fibre-reinforced polymer matrix composites used in aerospace.
For the energy sector, particularly in the development of materials for nuclear energy, meb ebsd analysis helps to determine the structure of irradiated materials and to understand their behaviour under irradiation. This makes it possible to develop more resistant materials for nuclear reactors, thereby improving safety and energy efficiency.
EBSD is employed for profiling and visualizing the intricate crystalline structures of solid-state materials, significantly impacting their physical and mechanical properties. As a result, EBSD finds applications in metallurgy for examining metal and alloy compositions, as well as in geological sciences for studying the influence of microstructures on rock and ore formation.
Considering that crystal structure affects magnetic and electrical properties, EBSD can also aid in the development of materials used in manufacturing computers, smart devices, and electrical supply equipment. Moreover, EBSD serves as a valuable tool for failure analysis, identifying the causes of corrosion or fracturing in various samples like thin films, metals, and semiconductor devices.
The EBSD detector connects to a scanning electron microscope, and a flat crystalline sample is inserted into the sample chamber for analysis. Electrons are then fired at the sample, typically at an angle of 70 degrees. The electrons interact with the sample and scatter upon colliding with the atoms within its structure.
These scattered electrons reach a phosphorescent screen, forming a pattern that depicts the diffraction and crystal structure of the sample. This data can be analyzed to make calculations and observations about the crystal structure, including grain shape, size, and orientation. Additionally, when combined with data acquired using an EDX detector, the elemental composition of the sample can be determined.
X-ray diffraction (XRD) is a scattering technique similar to EBSD. X-rays, being more penetrating than electrons, enable users to explore crystal structures deeply. XRD produces primarily quantitative data, which requires further interpretation or modeling to visualize the crystal structure. Thus, XRD is ideal for understanding bulk structures at a fundamental level. On the other hand, EBSD generates diffraction pattern images, offering one interpretation of a visual crystal structure. It provides surface and sub-surface analysis, making it suitable for studying localized microstructures rather than the overall structure. XRD and EBSD can be used in combination to obtain a comprehensive data set.
EBSD provides a fast and reliable method for analyzing crystal structures. It operates in a visual medium, enabling researchers to interpret results visually as well as mathematically. This technique offers data on multiple symmetry planes simultaneously, facilitating a comprehensive understanding of specific regions within a crystal structure.
However, a key limitation of EBSD is the requirement for a clean and undamaged sample surface to obtain accurate results. This necessitates intensive polishing and potentially multiple attempts to achieve high-quality outcomes.
