ToF-SIMS analysis in a laboratory
Your needs: characterize the extreme surface chemical composition of a sample using TOF-SIMS analysis
What is TOF-SIMS ?
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an imaging and analysis technique for obtaining elemental and molecular information on the species present at the extreme surface of solid-state samples.
In short, it provides information on the sample’s chemical composition, spatial distribution of elements and chemical bonds.
This technique can be applied to a wide variety of materials, including polymers, metallic materials, ceramics, and composite materials, films, glass and fiberglass, ceramics, dental implants, … without requiring complex sample preparation.
Why perform TOF SIMS analysis in the laboratory ?
TOF SIMS analysis is particularly valued for its ability to provide detailed information on the chemical composition of materials at both surface and depth (down to 1nm).
Not only can the surface be examined to identify the elements and molecules present, but depth profiles can also be produced by progressively removing layers, thus revealing compositional variations at different levels. What sets this technique apart is its ability to identify the molecular structure of compounds.
This dual analysis capability, spatial and molecular, makes TOF SIMS analysis indispensable for surface studies, the study of interactions between materials, the understanding of the presence of corrosion, the analysis of coatings and many other applications.
TOF SIMS, state-of-the-art technology
TOF SIMS analysis is a state-of-the-art technique offering high sensitivity and molecular resolution for extreme surface analysis and the study of the chemical composition of materials.
TOF-SIMS analysis provides qualitative and semi-quantitative information on the elements and molecules present. In addition, it is a high-resolution imaging technique that can map the distribution of elements and molecules on the surface of a sample with high spatial resolution. This capability enables the FILAB laboratory to understand surface heterogeneities and material interfaces.
ToF-SIMS is therefore a highly sensitive surface analysis technique, enabling detection limits of elements or molecules in the ppm range.
All conductive and insulating materials stable under ultra-high vacuum can be analyzed by ToF-SIMS: metals, alloys, semiconductors, polymers, varnishes, paints, adhesives, additives, surfactants, ceramics, glass, wood, paper, textiles, ultra-high vacuum, thin deposits…
Surface sensitivity of sims analysis
The high sensitivity of the TOF-SIMS technique makes it an excellent initial tool for identifying the types of species present on a sample. Once sims analysis has been performed, other methods can be used to obtain more detailed information, such as XPS. What’s more, sims analysis can detect species at much lower levels than traditional systems.
In static SIMS analysis, a pulsed primary beam targets only the first monolayer of the sample. Unlike dynamic SIMS analysis, this approach preserves the molecular integrity of the surface. Molecules are simply desorbed or fragmented into several pieces. Secondary ions, made up of fragments of the original molecules, are then detected by a time-of-flight spectrometer. Molecular ions weighing up to 10,000 amu can be identified, providing detailed information on the molecular structure of organic compounds.
Our solutions : offer TOF-SIMS analysis techniques specific to your requirements and deliver fast, reliable results
Why choose FILAB ?
The FILAB laboratory specializes in TOF-SIMS analysis for the study of the chemical and molecular composition of material surfaces. Adapted to sectors ranging from microelectronics to biotechnology, we combine expertise in extreme surface analysis and cutting-edge TOF SIMS technology to deliver accurate and reliable results, down to the nanoscale. Find out how our TOF-SIMS analyses can contribute to the success of your quality and innovation projects.
Our solution : to provide ToF-SIMS analysis techniques specific to your requests with reliable results
Our TOF SIMS analysis services
L’analyse ToF SIMS ou l’expertise de la composition chimique élémentaire et moléculaire de l’extrême surface d’un échantillon peut être mise en œuvre dans différents contextes :
These extreme surface analyses enable you to ensure the conformity of your products, and respond to industrial problems of failure and pollution identification.
Industrial applications of TOF-SIMS technology
TOF-SIMS analyses are in demand in various industries for their ability to characterize the chemical composition of surfaces with great sensitivity and resolution.
In the semiconductor industry, this technique is used to monitor material purity and device structure, directly affecting the performance and reliability of electronic components.
The pharmaceutical industry also takes advantage of TOF-SIMS for biocompatibility analysis, between medical device surfaces and the biological environment.
In materials research, TOF SIMS is used to understand the surface properties of new composite materials, with targeted properties.
In the energy sector, this technique is used to analyze materials for batteries and solar panels.
FAQ
Extreme surface analysis by TOF-SIMS involves first preparing the sample, then introducing it into the spectrometer's vacuum chamber. A beam of primary ions bombards the surface, releasing secondary ions which are then identified by their time-of-flight, enabling the chemical composition of the surface to be determined.
The principle consists in bombarding the surface to be analyzed with a pulsed source of primary ions (Ga+, Bin+, Au+, C60+, ...) to produce secondary ions from the first monoatomic layers of the sample. These secondary ions, whether positive or negative, are then focused and accelerated in a time-of-flight analyzer, where their travel time is a function of their mass. Coupled with a scanning device for the primary ion beam, this provides a map of the various chemical elements and molecular species on the sample surface.
TOF-SIMS can detect elements at extremely low concentrations, down to levels of a few parts per million (ppm), depending on the sample matrix and experimental conditions.
