Your needs: characterize the extreme surface chemical composition of a sample using FIB-TOF-SIMS analyses
What is FIB-TOF-SIMS?
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an imaging and analysis technique that provides elemental and molecular information on the species present at the extreme surface of solid-state samples.
In short, it provides information on the chemical composition, spatial distribution of elements and chemical bonds in the sample.
This technique can be applied to a wide variety of materials, including polymers, metallic materials, ceramics, and composite materials, without the need for complex sample preparation.
The FIB (Focused Ion Beam) uses a focused ion beam to remove material from the surface of samples and create cross-sections within the sample.
FIB-TOF-SIMS is a powerful and versatile technique for materials analysis, offering unique capabilities in terms of resolution, sensitivity and three-dimensional analysis. It plays a crucial role in ensuring product quality and safety, as well as in the research and development of new materials.
Why carry out a FIB-TOF-SIMS analysis in the laboratory?
FIB TOF SIMS analysis is particularly valued for its ability to provide detailed information on the chemical composition both at the surface and at the depth of materials (down to 1nm) using cross-sections.
Not only does it allow the surface to be examined to identify the elements and molecules present, it also allows depth profiles to be produced by progressively removing layers, revealing compositional variations at different levels. What sets this technique apart is its ability to identify the molecular structure of compounds.
This dual capacity for analysis – spatial and molecular– makesFIB-TOF-SIMS analysis essential for studying surfaces, studying interactions between materials, understanding the presence of corrosion,analysing coatings and many other applications.
Our solutions: offer TOF-SIMS analysis techniques specific to your requirements and deliver fast, reliable results.
Why choose FILAB?
The FILAB laboratory specialises in FIB-TOF-SIMS analysis, as part of the study of the chemical and molecular composition of material surfaces. Adapted to all industrial sectors, we combine expertise in extreme surface analysis and state-of-the-art technology with FIB TOF SIMS to provide accurate and reliable results, at the nanometric scale. Find out how our FIB-TOF-SIMS analyses can contribute to the success of your quality and innovation projects.
Our FIB TOF SIMS analysis services
Analysis or expert assessment using FIB ToF SIMS of the elemental and molecular chemical composition of the extreme surface of a sample can be carried out in various contexts:
Example of matrices
film, glass and fibreglass, ceramics, dental implants, etc.
