FILAB is an independent electron microscopy lab specialized in SEM analysis (Scanning Electron Microscopy) for particulate identification, contamination analysis, and surface characterization. Our laboratory supports industrial and scientific clients with precise, high-resolution imaging and elemental analysis, enabling them to investigate failures, assess product quality, and comply with strict industry standards.
Are you looking to identify an unknown particulate found in your products? Use SEM!
A particle is a very small, sometimes residual chemical substance or material. Particulate analysis by Scanning Electron Microscopy (SEM-EDX) is used to evaluate particles a few hundred microns across down to a few nanometers across.
Values obtained by analysis can be used to highlight important information such as maximal particulate size, particulate shape and origin.
Analysis of particulates and contaminants: a whole department at FILAB laboratory
FILAB laboratory is able to provide services for the analysis of particulates, suited to your needs:
OUR services
Chemical characterization of particulates and identification of contaminants by SEM and µ-FTIR
Spectral analysis of particles by FTIR
Granulometric analysis of particulates: laser granulometry, sieving…
Chemical analysis of dust
Analysis of particulates found in a pharmaceutical product
Analysis of surface cleanliness
What Is an electron microscopy lab?
An electron microscopy lab is a technical facility equipped to examine samples at the micro- and nanoscale using electron beams rather than light. Scanning Electron Microscopy (SEM) provides extremely detailed images of surfaces, particles, and fractures. Combined with EDX (Energy-Dispersive X-ray Spectroscopy), it allows for simultaneous morphological and chemical analysis of materials.
At FILAB, our electron microscopy laboratory is equipped with SEM-EDX instrumentation capable of analyzing solid surfaces, powders, coatings, films, and embedded particulates with exceptional clarity.
Use cases for SEM particle analysis
Microparticle contamination in cleanroom environments
Foreign particles in medical devices or injectable drugs
Surface defects or microcracks in coatings and films
Wear debris in mechanical components
Residual metallic particles in polymers or composites
Quality control of powders or nano-enhanced materials
- ISO 17025-accredited laboratory
- Fast turnaround and detailed technical reports
- SEM analysis with EDX mapping and quantitative data
- Expertise in materials science, pharmaceuticals, and microelectronics
- Investigation support for R&D, failure analysis, and regulatory audits
Our team provides customized electron microscopy testing services based on your industry, matrix, and technical objectives.
FAQ – Electron Microscopy Lab & SEM Analysis
It’s used for analyzing surface structures, detecting particles, identifying material composition, and investigating micro-scale defects.
Yes. With EDX, SEM can provide qualitative and semi-quantitative elemental composition of particulates.
Metals, polymers, powders, coatings, ceramics, biological materials (with preparation), and embedded contaminants.
Yes. We provide high-resolution SEM images, chemical mapping, and detailed expert interpretation.
